Glossary of technical terms for the use of metallurgical engineers Terms starting with alphabet ‘X
Glossary of technical terms for the use of metallurgical engineers
Terms starting with alphabet ‘X’
X-axis – It is one of the axes of a two- or three-dimensional graph. The X-axis is the horizontal plane of a graph in a Cartesian coordinate system. It is the principal or horizontal axis of a system of coordinates, points along which have a value of zero for all other coordinates. In composite laminates, X-axis is an axis in the plane of the laminate which is used as the 0-degree reference for designating the angle of a lamina.
X-bar chart – It is also known as X-bar control chart. It is a type of statistical process control chart used to monitor the mean (average) of a process over time. It is a visual tool which helps determine if a process is stable and predictable by plotting subgroup means and control limits. X-bar charts are frequently used in conjunction with R-charts (range charts) to monitor both the process mean and variability. The main goal of an X-bar chart is to identify when a process’s average value shifts or deviates significantly from its expected or target value.
X-bracing – It is a structural engineering practice where the lateral load on a building is reduced by transferring the load into the exterior columns. X-bracing allows for both higher performance from tall structures and the ability to open up the inside floorplan (and usable floor space) if the architect desires.
Xenoblast – It is a mineral grain within a rock which lacks its characteristic crystal faces since it has grown in a pre-existing matrix, frequently during metamorphism. Essentially, it is a crystal whose shape is determined by the surrounding material rather than its own inherent crystal structure.
Xenocryst – It is an individual foreign crystal included within an igneous body. Examples of xenocrysts are quartz crystals in a silica-deficient lava and diamonds within kimberlite diatremes.
Xenolith – It is a fragment of country rock enclosed in an intrusive rock.
Xenon (Xe) – It is a chemical element having atomic number 54. It is a dense, colourless, odourless noble gas. Although normally unreactive, it can undergo a few chemical reactions such as the formation of xenon hexa-fluoro-platinate, the first noble gas compound to be synthesized. Xenon is used in flash lamps and arc lamps. Naturally occurring xenon consists of seven stable isotopes and two long-lived radioactive isotopes. More than 40 unstable xenon isotopes undergo radioactive decay, and the isotope ratios of xenon are an important tool for studying the early history of the Solar system. Radioactive xenon-135 is produced by beta decay from iodine-135 (a product of nuclear fission), and is the most significant (and unwanted) neutron absorber in nuclear reactors.
Xeriscaping – It is a creative landscaping design for conserving water which uses drought-resistant or drought-tolerant plants.
Xerogel – It is a solid formed from a gel by drying with unhindered shrinkage. Xerogels normally retain high porosity (15 % to 50 %) and huge surface area (150 square meters per gram to 900 square meters per gram), along with very small pore size (1 nano meter to 10 nanometers). When solvent removal occurs under supercritical conditions, the network does not shrink and a highly porous, low-density material known as an ‘aerogel’ is produced. Heat treatment of a xerogel at high temperature produces viscous sintering (shrinkage of the xerogel because of a small quantity of viscous flow) which results in a denser and more robust solid, the density and porosity achieved depend on the sintering conditions.
Xerography – It is a dry copying process in which black or coloured powder adheres to parts of a surface remaining electrically charged after being exposed to light from an image of the document to be copied. It is a dry photocopying technique. Originally called electro-photography, it has been renamed to emphasize that is uses no liquid chemicals, unlike reproduction techniques then in use such as cyanotype.
Xero-radiography – It is a type of imaging which uses electrostatic and dry processing to produce X-ray images, unlike traditional film-based radiography which uses chemical processing. It involves charging a photoconductive plate, exposing it to X-rays, and then developing the image with a charged toner powder that is transferred to paper.
Xerox – It means to copy on a xerographic copier. It is to make (a copy) on a xerographic copier.
XHTML – It is acronym for ‘Extensible HyperText Markup Language. It is part of the family of XML markup languages which mirrors or extends versions of the widely used HyperText Markup Language, the language in which Web pages are formulated.
X-intercept – It is the point where a line, curve, or surface crosses the X-axis of a graph. At this point, the Y-coordinate is always zero. It -‘s also known as the horizontal intercept.
XLPE – It is an acronym for linked polyethylene. XLPE is a thermosetting polymer meaning that the material (polyethylene (PE)) is cured under heat and in that process forms bonds in all directions forming a three-dimensional matrix. The cross-linking process enhances its thermal, mechanical, and electrical properties, making it suitable for various applications, including high-voltage cables. Within this XLPE matrix, there is space between the individual molecules. Contaminants introduced at the initial manufacture or during the cable service life can infiltrate the XLPE matrix and degrade the overall insulation performance. It is a type of insulation material, normally used in electrical cables, which offers several advantages over traditional materials like poly vinyl chloride (PVC). It is also used predominantly in building services pipework systems, hydronic radiant heating and cooling systems, and domestic water piping.
XLPE (cross linked polyethylene) cable – It is a type of electrical cable insulated with cross-linked polyethylene, a thermoset plastic material. This cross-linking process improves the material’s properties, making it suitable for power transmission and distribution. This thermo-setting XLPE insulation material provides extra-ordinary electrical, thermal, and mechanical properties to the cables, like low dielectric loss, excellent dielectric strength, higher continuous current rating, high resistance to thermal ageing etc.
XML – It is acronym for ‘Extensible Markup Language’. Itis a markup language and file format for storing, transmitting, and reconstructing data. It defines a set of rules for encoding documents in a format which is both human-readable and machine-readable. The design goals of XML emphasize simplicity, generality, and usability across the Internet. XML has come into common use for the interchange of data over the Internet. Hundreds of document formats using XML syntax have been developed.
X-radiation – It is an electro-magnetic radiation of the same nature as visible light, but having a wave-length around 1/1,000 that of visible light. It is normally referred to as X-rays.
X-ray – It is also known as roentgen ray or X-radiation. It is a penetrating electromagnetic radiation, normally generated by accelerating electrons to high velocity and suddenly stopping them by collision with a solid body. It is the radiation which is produced in the electron shell of atoms. It is characterized by very short wave-lengths and high energy. It is a type of ionizing radiation, meaning it has enough energy to remove electrons from atoms and potentially damage living tissue. Wave-lengths of X-rays range from around 0.01 nanometers to 10 nanometers. This range falls between ultraviolet light and gamma rays on the electromagnetic spectrum. X-rays wave-length range corresponds to energies in the range from 0.125 kilo-electron volts to 125 kilo-electron volts. The wave-length of X-rays is inversely proportional to its energy.
X-ray absorption – X-rays impinging on a sample undergo two important interactions with the elements of the sample: absorption and scatter. Absorption of the radiation can occur by specific interactions which are considerable in sample excitation in X-ray spectrometry or by more general interactions which influence the emitted X-ray intensity from the sample. Scatter of X-rays leads to background intensity in the observed spectra.
X-ray continuum – Emission of X-rays with a smooth, continuous function of intensity relative to energy is called X-ray continuum, or bremsstrahlung, radiation. An X-ray continuum can be generated in several ways. However, the most useful is the electron beam used to bombard a target in an X-ray tube. The X-ray continuum is generated as a result of the progressive deceleration of high-energy electrons impinging on a target, which is a distribution of orbital electrons of various energies. As the impinging electrons interact with the bound orbital electrons, some of their kinetic energy is converted to radiation. The amount converted depends on the binding energy of the electron involved. Hence, a somewhat statistical probability exists as to how much energy is converted with each interaction.
X-ray crystallography – It is a technique which is used to determine the three-dimensional structure of molecules by analyzing how X-rays diffract when passed through a crystalline sample. Essentially, it reveals the arrangement of atoms within a crystal by studying the pattern of scattered X-rays.
X-ray diffraction (XRD) – It is a laboratory method for establishing the structure of a crystalline solid by directing single wave-length X-rays at the solid and analyzing the resulting diffraction pattern. It is an analytical technique in which measurements are made of the angles at which X-rays are preferentially scattered from a sample (as well as of the intensities scattered at different angles) in order to deduce information on the crystalline nature of the sample, such as its crystal structure, orientations, and so on.
X-ray diffraction (XRD) profiles – These are also known as diffractograms. These are graphical representations of the intensity of X-rays scattered by a crystalline material as a function of the scattering angle. These profiles provide valuable information about the material’s structure, including its crystal structure, phase identification, and crystallite size.
X-Ray diffraction residual stress techniques – In X-ray diffraction residual stress measurement, the strain in the crystal lattice is measured, and the residual stress producing the strain is calculated, assuming a linear elastic distortion of the crystal lattice. Although the term stress measurement has come into common usage, stress is an extrinsic property which is not directly measurable. All methods of stress determination need measurement of some intrinsic property, such as strain or force and area, and the calculation of the associated stress. Mechanical methods (dissection techniques) and non-linear elastic methods (ultrasonic and magnetic techniques) are limited in their applicability to residual stress determination. Mechanical methods are limited by assumptions concerning the nature of the residual stress field and sample geometry. Mechanical methods, being necessarily destructive, cannot be directly checked by repeat measurement. Spatial and depth resolution are orders of magnitude less than those of X-ray diffraction. All non-linear elastic methods are subject to major error from preferred orientation, cold work, temperature, and grain size. All need stress-free reference samples, which are otherwise identical to the sample under investigation. Non-linear elastic methods are normally not suitable for routine residual stress determination at their current state of development. In addition, their spatial and depth resolutions are orders of magnitude less than those of X-ray diffraction. To determine the stress, the strain in the crystal lattice is to be measured for at least two precisely known orientations relative to the sample surface. Hence, X-ray diffraction residual stress measurement is applicable to materials which are crystalline, relatively fine grained, and produce diffraction for any orientation of the sample surface. Samples can be metallic or ceramic, provided a diffraction peak of suitable intensity and free of interference from neighbouring peaks can be produced in the high back-reflection region with the radiations available. X-ray diffraction residual stress measurement is unique in that macroscopic and microscopic residual stresses can be determined non-destructively. Macro-stresses and micro-stresses can be determined separately from the diffraction-peak position and breadth
X-ray diffractometer – It is an instrument which uses X-ray diffraction to analyze the structure of materials by measuring the angles and intensities of diffracted X-rays. It is a crucial tool for determining the crystallographic structure, phase composition, and other structural details of crystalline materials.
X-ray diffractometry (XRD) – It is a technique which analyzes the crystalline structure of a sample by measuring the diffraction of X-rays. It is a powerful, non-destructive method used to identify phases, determine crystal structures, and assess other structural properties of materials.
X-ray electron spectroscopy – It is a surface-sensitive technique used to determine the elemental composition and chemical states of a material’s surface. It works by irradiating a sample with X-rays, causing core-level electrons to be emitted. Analyzing the kinetic energy and intensity of these emitted electrons provides information about the elements present, their chemical bonding, and their oxidation states.
X-ray emission – X-rays are generated from the disturbance of the electron orbitals of atoms. This can be done in several ways, the most common being bombardment of a target element with high-energy electrons, X-rays, or accelerated charged particles. The first two are frequently used in X-ray spectrometry directly or indirectly. Electron bombardment results in a continuum of X-ray energies as well as radiation characteristic of the target element. Both types of radiation are encountered in X-ray spectrometry.
X-ray emission spectroscopy – It is pertaining to emission spectroscopy in the X-ray wave-length region of the electro-magnetic spectrum.
X-ray fluorescence (XRF) – It is the emission by a substance of its characteristic X-ray line spectrum on exposure to X-rays. X-ray fluorescence is used to detect and measure the concentration of elements in substances. Fluorescence is the phenomena of absorbing incoming radiation and reradiating it as lower-energy radiation.
X-ray fluorescence (XRF) spectrometer – It measures the sum of the primary and secondary fluorescence, and it is impossible to distinguish between the two contributions. The contribution of secondary fluorescence to the characteristic radiation can be considerable (of the order of 20 %). Similarly, tertiary and even higher order radiation can occur. In almost all practical situations, these are negligible, but in very specific cases, these can reach values of 3 %. As the sample gets thicker and thicker, more radiation is absorbed. Eventually radiation produced in the deeper layers of the sample is no longer able to leave the sample. When this limit is reached depends on the material and on the energy of the radiation. When a sample is measured, only the atoms within the analysis depth are analyzed. If samples and standards with different thicknesses are analyzed, the thickness has to be taken into account. X-ray fluorescence spectrometer systems can be divided into two main groups namely (i) energy dispersive systems (EDXRF), and (ii) wavelength dispersive systems (WDXRF). The elements which can be analyzed and their detection levels mainly depend on the spectrometer system used. The elemental range for EDXRF goes from sodium to uranium (Na to U). For WDXRF it is even wider, from beryllium to uranium (Be to U). The concentration range goes from (sub) parts per million (ppm) levels to 100 %. Normally speaking, the elements with high atomic numbers have better detection limits than the lighter elements.
X-ray fluorescence (XRF) spectrometry – It is a versatile tool in several analytical problems. It is an analytical method to determine the chemical composition of all kinds of materials. The materials can be in solid, liquid, powder, filtered or other form. It can also sometimes be used to determine the thickness and composition of layers and coatings. The method is fast, accurate, and non-destructive, and normally needs only a minimum of sample preparation. Applications are very broad and include the metal, cement, oil, polymer, plastic and food industries, along with mining, mineralogy and geology, and environmental analysis of water and waste materials.
X-ray fluorescence (XRF) spectroscopy – It is an analytical technique used to determine the elemental composition of materials. It works by exposing a sample to high-energy X-rays, which causes the sample’s atoms to emit characteristic X-rays. By analyzing these emitted X-rays, the types and quantities of elements present in the sample can be identified.
X-ray interference lines – These are also known as diffraction patterns. These are formed when X-rays are scattered by the atoms in a material, and the scattered waves then interfere with each other, either constructively (creating bright lines or spots) or destructively (creating dark areas). This interference pattern provides information about the structure and arrangement of atoms within the material.
X-ray line broadening – It refers to the widening of diffraction peaks observed in X-ray diffraction patterns beyond their expected or theoretical width. This broadening is a result of different factors related to the sample’s microstructure and the experimental setup. Line broadening is caused by a combination of instrumental and sample-related factors, including spectrometer resolution, X-ray source characteristics, crystallite size, lattice strain, defects, disorder, and thermal effects.
X-ray lithography – It is a developing technique for production of very high-density structures in integrated circuits.
X-ray map – It is an intensity map (normally corresponding to an image) in which the intensity in any area is proportional to the concentration of a specific element in that area.
X-ray monitoring – It refers to the use of X-ray technology to observe and analyze changes in a subject, frequently in real-time, for several purposes like medical diagnosis, industrial quality control, or scientific research. In medical settings, it involves using X-rays to create images of internal body structures for diagnosis and treatment monitoring, while in other fields, it can involve observing changes in material properties or detecting anomalies. In case of conveyors, it is an advanced method to scrutinize the entire conveyor belt’s condition.
X-ray photoelectron spectroscopy (XPS) – It is an analytical technique which measures the energy spectra of electrons emitted from the surface of a material when exposed to monochromatic X-rays. It is a surface-sensitive quantitative spectroscopic technique that measures the very topmost 50 to 60 atoms, 5 nanometers to 10 nanometers of any surface. It belongs to the family of photo-emission spectroscopies in which electron population spectra are got by irradiating a material with a beam of X-rays. X-ray photoelectron spectroscopy is based on the photoelectric effect which can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. X-ray photoelectron spectroscopy is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to. The technique can be used in line profiling of the elemental composition across the surface, or in-depth profiling when paired with ion-beam etching. It is frequently applied to study chemical processes in the materials in their as-received state or after cleavage, scraping, exposure to heat, reactive gasses or solutions, ultraviolet light, or during ion implantation.
X-ray photons – These are a type of electromagnetic radiation characterized by high energy and short wavelengths, capable of penetrating matter. They are produced when high-speed electrons interact with matter, frequently within an X-ray tube, and can be used in several applications. X-ray photons carry enough energy to ion the atoms and break the molecular bonds. It is a type of ionizing radiation and is hence harmful to living tissues.
X-ray photo-electron spectroscopy (XPS) – It is also known as electron spectroscopy for chemical analysis (ESCA), is a surface-sensitive technique used to analyze the elemental composition and chemical state of a material’s surface. It works by irradiating a sample with X-rays and measuring the kinetic energy and number of emitted electrons. This data provides information about the elements present and their chemical bonding environments on the surface, typically within the topmost 1 nanometer to 10 nanometers. X-ray photo-electron spectroscopy is based on the photoelectric effect, where photons (X-rays in this case) eject core-level electrons from the atoms of a material.
X-ray powder diffraction (XRPD) techniques – These techniques are used to characterize samples in the form of loose powders or aggregates of finely divided material. These techniques cover several investigations, including qualitative and quantitative phase identification and analysis, determination of crystallinity, micro-identification, lattice-parameter determinations, high temperature studies, thin film characterization, and, in some cases, crystal structure analysis. The powder method, as it is referred to, is perhaps best known for its use as a phase characterization tool partly since it can routinely differentiate between phases having the same chemical composition but different crystal structures (polymorphs). Although chemical analysis can indicate that the empirical formula for a given sample is FeTiO3, it cannot determine whether the sample is a mixture of two phases (FeO and one of the three polymorphic forms of TiO2) or whether the sample is the single-phase mineral FeTiO3 or ilmenite. The ability of X-ray powder diffraction to perform such identifications more simply, conveniently, and routinely than any other analytical method explains its importance in several industrial applications as well as its wide availability and prevalence. In general, an X-ray powder diffraction characterization of a substance consists of placing a powder sample in a collimated mono-chromatic beam of X-radiation.
X-ray powder diffractometry – It involves characterization of materials by use of data which are dependent on the atomic arrangement in the crystal lattice.
X-ray profile analysis – It is also known as X-ray line profile analysis (XLPA) or X-ray peak profile analysis (XPPA). It is a non-destructive technique used to characterize the micro-structure of crystalline materials. It analyzes the broadening and shape of X-ray diffraction peaks to extract information about crystallite size, lattice strain, and other micro-structural features.
X-ray radiography – It is an imaging technique using X-rays to view the internal form of an object. Applications of X-ray radiography include industrial radiography. To create an image in conventional radiography, a beam of X-rays is produced by an X-ray generator and it is projected towards the object. A certain amount of the X-rays or other radiation are absorbed by the object, dependent on the object’s density and structural composition. The X-rays which pass through the object are captured behind the object by a detector (either photographic film or a digital detector). The generation of flat two-dimensional images by this technique is called projectional radiography.
X-ray spectrograph – It is a photographic instrument for X-ray emission analysis. If the instrument for X-ray emission analysis does not use photography, it is better described as an X-ray spectrometer.
X-ray spectrometer – It is an analytical instrument which uses X-rays to determine the elemental composition and chemical states of a substance. It works by exciting atoms within a sample with X-rays, causing them to emit characteristic X-rays which are then analyzed to identify the elements present and their concentrations.
X-ray spectrometry – It is the measurement of wave-lengths of X-rays by observing their diffraction by crystals of known lattice spacing. It is an emission spectroscopic technique which has found wide application in elemental identification and determination. The technique depends on the emission of characteristic X-radiation, normally in the 1 kilo-electron volt to 60 kilo-electron volts energy range, following excitation of atomic electron energy levels by an external energy source, such as an electron beam, a charged particle beam, or an X-ray beam. In majority of the sample matrices, X-ray spectrometry can detect elements at concentrations of less than 1 micro gram per gram of sample (1 parts per million). In a thin film sample, it can detect total quantities of a few tenths of one microgram. Initially, X-ray spectrometry found wide acceptance in applications related to metallurgical and geochemical analyses. More recently, X-ray spectrometry has proved valuable in the analysis of environmental samples, in the determination of sulphur and wear elements in petroleum products, in applications involving forensic samples, and in measurements of electronic and computer-related materials.
X-ray spectrum – It is the plot of the intensity or number of X-ray photons against energy (or wave-length).
X-ray tomography – It is a method of imaging the internal structure of materials in which an X-ray beam is passed through the sample in multiple directions. The density throughout the sample is reconstructed by a computer from the transmitted X-ray signal.
X-ray topography – It is a technique which comprises topography and X-ray diffraction. The term topography refers to a detailed description and mapping of physical (surface) features in a region. In the context of the X-ray diffraction, topographic methods are used to survey the lattice structure and imperfections in crystalline materials. The method and procedure used depend largely on the density of defects present and the nature of the crystalline material to be examined, but all methods share the capability for non-destructive application. Research in the semi-conductor/ device and structural / mechanical materials industries, both of which use topographic techniques extensively, is focused on the study of similar features of the crystal lattice, but on different levels.
X-ray tube – It is a device which generates X-rays by converting electrical energy into a stream of electrons which are then accelerated and directed at a target material, causing the emission of X-rays. X-ray tube is used for the generation of X-rays by bombarding highly accelerated electrons on a heavy metal target. These tubes are typically housed within a vacuum to optimize electron flow and prevent unwanted interactions. X-rays are only produced as long as the X-ray tube is energized. X-ray tubes are also used in X-ray crystallography, material and structure analysis, and for industrial inspection.
X-ray tube window – It is a small part of the tube envelope made of low-attenuation material (normally beryllium), which lets the desired imaging X-ray beam out of the tube. Radiation emitted in all other directions is absorbed by the tube envelope or housing. Since beryllium has excellent transparency to soft X-rays and other radiations such as gamma rays, it is used in X-ray tube window. Because of its low atomic weight, beryllium passes X-rays 17 times better than an equivalent thickness of aluminum. Beryllium X-rays windows allow the use of long wave X-rays which have higher intensity. Majority of these need application disks which are thicker than 0.25 millimeters and are cut from sheet or machined from vapour hot pressed blocks.
X-ray turbidimetry – Turbidimetry methods are used to determine the particle size distribution of refractory metal powders, such as tungsten and molybdenum, and of refractory metal compound powders, such as tungsten carbide. Turbidimeter is the standard equipment for turbidimetry. In X-ray turbidimetry, X-rays are used instead of white light to determine particle size distribution of a sub-sieve particle suspension. In this process, the attenuation of the X-ray beam intensity is proportional to the mass of the powder particles rather than their projected area.
X-section – It is the non-empty intersection of a solid body in three-dimensional space with a plane, or the analog in higher-dimensional spaces. Cutting an object into slices creates several parallel X-sections. The boundary of a X-section in three-dimensional space which is parallel to two of the axes, i.e., parallel to the plane determined by these axes, is sometimes referred to as a contour line, e.g., if a plane cuts through mountains of a raised-relief map parallel to the ground, the result is a contour line in two-dimensional space showing points on the surface of the mountains of equal elevation. In technical drawing a X-section, being a projection of an object onto a plane that intersects it, is a common tool used to depict the internal arrangement of a 3-dimensional object in two dimensions. It is traditionally cross-hatched with the style of cross-hatching frequently indicating the types of materials being used. X-section is the shape of importance to designers. However, for X-sections, the designer is to consider two conditions in order to cover all the possible design combinations which can be encountered.
XTEM – It is the cross-sectional transmission electron microscopy. It is a technique used to analyze the structure of materials at a very small scale, specifically by imaging a thin slice of the material. This allows people to see the internal structure of a sample, revealing details about its composition and arrangement of atoms in a direction perpendicular to the surface.
Xylene – It is also known as xylol or di-methyl-benzene (any one of three isomers of di-methyl-benzene, or a combination thereof). With the formula C8H10, each of the three compounds has a central benzene ring with two methyl groups attached at substituents. They are all colourless, flammable liquids, some of which are of great industrial value. The mixture is referred to as both xylene and, more precisely, xylenes. The molar mass of xylene is 106.16 grams per mol. There are three isomeric xylenes, or substances of the composition and molecular weight corresponding to C8H10. The isomers can be distinguished by the designations ortho-xylene (o-), meta- xylene (m-) and para-xylene (p-), which specify to which carbon atoms (of the benzene ring) the two methyl groups are attached. By counting the carbon atoms around the ring starting from one of the ring carbons bonded to a methyl group, and counting towards the second methyl group, the ortho- isomer has the IUPAC (International Union of Pure and Applied Chemistry) name of 1,2-di-methyl-benzene, the meta-isomer is 1,3-di-methyl-benzene and the para-isomer is 1,4-di-methyl-benzene. Of the three isomers, the p-isomer is the most industrially sought after since it can be oxidized to terephthalic acid. Xylene is used as a solvent. As solvent, xylene frequently contains a small percentage of ethyl-benzene. Like the individual isomers, the mixture is colourless, sweet-smelling, and highly flammable. Areas of application include the printing, rubber, and leather industries. It is a common component of ink, rubber, and adhesives. In thinning paints and varnishes, it can be substituted for toluene where slower drying is desired, and hence is used by conservators of art objects in solubility testing. Similarly, it is a cleaning agent, e.g., for steel, silicon wafers, and integrated circuits. In the petroleum industry, xylene is also a frequent component of paraffin solvents, used when the tubing becomes clogged with paraffin wax.
Xylenol – It is an organic chemical compound that is a derivative of phenol, with two methyl groups (CH3) attached to the benzene ring in addition to the hydroxyl group (OH). It is also known as dimethylphenol. There are six possible isomers of xylenol, depending on the positions of the methyl groups.
XY co-ordinates – In a two-dimensional coordinate system, x and y coordinates represent a point’s location on a plane. The x-coordinate (also called the abscissa) is the horizontal position, while the y-coordinate (also called the ordinate) is the vertical position. These coordinates are typically written as an ordered pair (x, y).
XY plane – In composite laminates, it is the reference plane parallel to the plane of the laminate.
XYZ co-ordinates – These co-ordinates define the position of a point in three-dimensional space. They are used in several fields like mathematics, computer graphics, and engineering to represent locations in a 3D world. The three axes (X, Y, and Z) are mutually perpendicular and intersect at a point called the origin (0,0,0).
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